Crossing and Branching Nodes in Soft-Lithography-based Optical Interconnects.

Wei Ni,Jing Wu,X. Wu
DOI: https://doi.org/10.1364/oe.15.012872
IF: 3.8
2007-01-01
Optics Express
Abstract:We investigate the characteristics of crossing and branching nodes in monolayer soft-lithography-based polymer optical interconnects with experimental and theoretical analysis. The theoretical crosstalk, as calculated by a function of crossing angle, was determined for a set of interconnect pairs with varying cross-sections, and was compared with experimental measurements. Furthermore, a suitable branching angle was found for branching node and the effects of short-distance mode scrambling in highly multimode polymer waveguides were studied in detail. It was found that mode-filling occurred within a propagation distance of 1.5mm for a 50x50mum2 cross-section for VCSEL coupling; however, complete scrambling of ray direction required a propagation distance of more than 5mm.
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