Strategies for Aberration Control in Sub-Angstrom HRTEM

A Thust,J Barthel,L Houben,C L Jia,M Lentzen,K Tillmann,K Urban
DOI: https://doi.org/10.1017/s1431927605503386
IF: 4.0991
2005-01-01
Microscopy and Microanalysis
Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005
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