Switching Properties Of Nd- And La-Doped Bi4ti3o12 Thin Films Under Applied Stress

Xiaomei Lu,Xiumei Wu,Liben Li,Dong Qian,Wei Li,Yuda Ye,Xiaoshan Wu,Jinsong Zhu
DOI: https://doi.org/10.1103/PhysRevB.72.212103
IF: 3.7
2005-01-01
Physical Review B
Abstract:The stress impact on the switching properties of Nd- and La-doped Bi4Ti3O12 films were investigated. When the electric field E was kept constant, the net-switched charge Q increased with the stress changing from maximum compression to maximum tension, while the switching time t(s) increased with increasing both compressive and tensile stress. When E was variable, the variation of Q(E) got enhanced, while that of t(s)(E) got weakened under both compressive and tensile stress. These could be well explained by stress-induced reorientation of domains instead of strain-polarization coupling, which is further confirmed by Landau-Ginzburg calculations and x-ray-diffraction measurements.
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