FIELD-DEPENDENT FERROELECTRIC PROPERTIES OF BLT THIN FILMS UNDER DIFFERENT STRESS

Xiumei Wu,Fengzhen Huang,Xiaomei Lu,Xu Wang,Yi Kan,Jun Ma,Wei Cai,Jinsong Zhu
DOI: https://doi.org/10.1080/10584580601086998
2006-01-01
Integrated Ferroelectrics
Abstract:ABSTRACT The field-dependent ferroelectric properties of Bi3.25La0.75Ti3O12 thin films under different stress were studied. It was found that, when the voltage increased from 3 V to 16 V, the remnant polarization and the coercive field increased for the films either under stress or not. Under both compressive and tensile stress, the above tendency of the remnant polarization and the coercive field got enhanced. It was also found that, the fatigue properties of films deteriorated with the measured voltage decreasing. The pinning of the domain walls and the coarsening of the domains induced by stress were used to discuss the above results.
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