Bias Voltages and Growth of Sputtered Al_2O_3 Films on Polythylene Terephthalate Substrates

Lin Jing,Liu Zhuang,Sun Zhi-hui,Gao De
DOI: https://doi.org/10.3969/j.issn.1672-7126.2009.z1.21
2009-01-01
Abstract:The Al_2O_3 films were grown by DC magnetron sputtering on polythylene terephthalate(PET)substrates. The microstructures and electronic properties of the Al_2O_3 films were characterized with atomic force microscopy(AFM) and X-ray photoelectron spectroscopy(XPS).The influence of film growth conditions on film quality was studied.The results show that the bias affects the substrate temperature and properties of the Al_2O_3 films to a varying degree.For example, as the bias voltage increases,the substrate temperature slightly rises up and the surface roughness decreases.Besides, a high suitable bias favors stable stoichiometry of Al_2O_3,and an optimized bias improves the oxygen transition rate(OTR) of the films.Possible mechanisms were tentatively discussed.
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