Transfer of Au Cusp-clusters on Si(111) 7×7 Surfaces from a Pure Au Tip of a Scanning Tunneling Microscope

Q.D. Jiang,D. Fujita,H.Y. Sheng,Z.C. Dong,H. Nejoh
DOI: https://doi.org/10.1007/s003390050527
1997-01-01
Abstract:We investigate fabrication of nanometer-sized Au mounds on Si(111) 7 x 7 surfaces in ultrahigh vacuum by applying voltage pulses to a pure Au tip of a scanning tunneling microscope. We demonstrate that Au mounds can be created by direct tip-surface contact even without tip-sample bias, apparently an indication of a non-field evaporation process. The stability of as-created Au mounds under repeated STM scans and upon in-situ thermal annealing are examined. The probability of Au deposition reaches about 70% when the voltage pulses applied to the tip ranged from -4.8 V to -7.0 V with a pulse duration from 10 mu sec to 10 msec. Immediately after the pulses, the Si(111)7 x 7 reconstruction, only several nanometers from the created Au mound and crater, can still be atomically resolved with the same tip. Our results suggest that the mounds are created by contact between the tip and sample surface, enlongation of the contact neck, followed by cusp formation, a process in which the ductile nature of Au plays an important role. Craters in the surface are created by field evaporation.
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