Research on the Reliability of GaN-based Violet LED

SHANG Shuping,YU Tongjun,CHEN Zhizhong,ZHANG Guoyi
DOI: https://doi.org/10.3321/j.issn:1005-3093.2006.02.008
2006-01-01
Abstract:Optical power of violet light emitting diodes were measured during DC aging test up to 312h at different current levels(20 and 40mA),and different ambient temperatures(room temperature and 60℃).It was found that violet LED optical power decreased drasmaticaly with aging time within 48 h and slowly after 48h.Analyzing the I-V curve of virgin violet LED and aged ones,tunneling current is the main component of reverse current and forward current at low bias.It is believed that tunneling current increases mainly because large amount of defects,which provides opportunity of electron tunneling from n-GaN to p-GaN involving unradiative recombination processes.
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