Optical power degradation mechanisms in 271 nm AlGaN-based deep ultraviolet light-emitting diodes

Chu-Hui Shen,Ren-Long Yang,Hong-Lin Gong,Li-Hong Zhu,Yu-Lin Gao,Guo-Long Chen,Zhong Chen,Yi-jun Lu
DOI: https://doi.org/10.1364/oe.486393
IF: 3.8
2023-06-03
Optics Express
Abstract:Chu-Hui Shen, Ren-Long Yang, Hong-Lin Gong, Li-Hong Zhu, Yu-Lin Gao, Guo-Long Chen, Zhong Chen, Yi-jun Lu The degradation of AlGaN-based UVC LEDs under constant temperature and constant current stress for up to 500 hrs was analyzed in this work. ... [Opt. Express 31, 20265-20273 (2023)]
optics
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