The Reflectance of Solid-Phase Epitaxial Pd/Ge Film on GaAs and Its Application for VCSELs Array

WX CHEN,PF JIAO,JH ZHAO,SM WANG,SC GUAN,QX CHEN
DOI: https://doi.org/10.1016/0038-1098(93)90614-s
IF: 1.934
1993-01-01
Solid State Communications
Abstract:Solid-Phase Epitaxial Pd/Ge Ohmic contact to GaAs has a low specific contact resistivity (5×10-7 cm-2 on 1018 cm-3 n-GaAs). The cross-sectional TEM photomicrograph shows the interface between the contact and the GaAs is planar and abrupt to within atomic dimensions. The reflectance of Pd/Ge films on GaAs was pressured for the first time. The films were employed as both mirrors and electrodes for Vertical Cavity Surface-emitting Lasers (VCSELs) array.
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