Band-Bending at the Graphene–SiC Interfaces: Effect of the Substrate

Wei Chen,Shi Chen,Zhen Hua Ni,Han Huang,Dong Chen Qi,Xing Yu Gao,Ze Xiang Shen,Andrew Thye Shen Wee
DOI: https://doi.org/10.1143/JJAP.49.01AH05
IF: 1.5
2010-01-01
Japanese Journal of Applied Physics
Abstract:In-situ synchrotron-based photoemission spectroscopy, low-temperature scanning tunneling microscopy and Raman spectroscopy are used to investigate the interface properties of graphene on both the (0001) and (000 (1) over bar) 6H-SiC (Si-and C-terminated surfaces). We clearly observe the upward band-bending upon the formation of interfacial graphene, which depends on the surface polarity of the underlying SiC substrate, i.e., a weak upward band bending by 0.4 eV forms on the Si-terminated 6H-SiC(0001); while a much larger upward band bending by 1.3 eV appears on the C-terminated 6H-SiC(000 (1) over bar). (C) 2010 The Japan Society of Applied Physics
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