A GaN photodetector integrated structure for wavelength characterization of ultraviolet light

D G Zhao,D S Jiang,J J Zhu,Z S Liu,S M Zhang,Hui Yang
DOI: https://doi.org/10.1088/0268-1242/23/9/095021
IF: 2.048
2008-01-01
Semiconductor Science and Technology
Abstract:An interesting GaN photodetector structure, which can be used for characterizing the wavelength of incident ultraviolet light, is proposed. It is composed of two back-to-back integrated diodes, i.e. p-n and p-i-n GaN ultraviolet photodiodes with different spectral response. The wavelength of monochromatic ultraviolet light could be identified by measuring the photocurrent ratio value through a simple electronic circuit.
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