The reliability of micro-accelerometer in harsh environment

GAO JIANFEI,XIONG JIJUN,GUO TAO,SHI YUNBO
DOI: https://doi.org/10.3969/j.issn.1008-0570.2007.35.092
2007-01-01
Abstract:The reliability of the micro-accelerometer, which is the critical factor for accelerometer running into the market. This paper discusses the failure modes of piezoresistive cantilevered accelerometer in different environment, and gives some advices about the design of the accelerometer, others could get some information from these advices.
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