Integrated Testing Analyzer for the Resonant Silicon Microstructure Sensor

LI Qing-feng,XING Wei-wei,FAN Shang-chun
DOI: https://doi.org/10.3969/j.issn.1002-1841.2009.z1.080
2009-01-01
Abstract:An integrated testing analyzer for the resonant silicon microstructure sensor was presented.The analyzer is applied to the testing,analysis and evaluation of the key links of the micromachined resonant sensor,and is mainly for establishment of the testing object model,weak signal processing and evaluation of the testing data.The modularized and opening testing instrument is integrated with the related theories and technologies.This testing instrument has important significance for thoroughly grasping the characteristics and the optimization method for the resonantor and the closed - loop system of the resonant silicon miciostructure sensor, and is essential to develope the high-performance microsensor.
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