Chip Level Measurement Technique for Capacitive RF Micromechanical Resonators

王蕴达,蔡明,谭秀颖,陈兢
DOI: https://doi.org/10.3969/j.issn.1671-7449.2008.04.006
2008-01-01
Abstract:The measurement technique and theory of micromechanical resonators assisted by clamped-clamped beam were studied,mainly focusing on problems of signal actuating and detecting brought by feebleness of signal and terrible parasitic effects in the chip level electrical measurement of capacitive RF micro-resonators.Mechanical equivalent circuits of micromechanical resonators with parasitic parameters were defined with method of mechanical-to-electrical analogy and employed for simulation by using Agilent ADS software.The effects of the parasitic parameters were evaluated,based on which,a well shield one-port measurement setup was developed on probe station for the chip level test. With proper bias,resonators were measured on chip level and the amplitude-frequency characteristic curve of an 8.6 MHz resonator was gained,which corresponded well to the design.
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