Development of Ultra High Sensitivity Uv Silicon Carbide Detectors

Feng Yan,Xiaobin Xin,Petre Alexandrov,Carl M. Stahle,Bing Guan,Jian H. Zhao
DOI: https://doi.org/10.4028/www.scientific.net/msf.527-529.1461
2006-01-01
Materials Science Forum
Abstract:A variety of silicon carbide (SiC) detectors have been developed to Study their sensitivity, including Schottky photodiodes, p-i-n photodiodes, avalanche photodiodes (APDs), and single photon-counting APDs. Due to the very wide bandgap and thus extremely low leakage Current, SiC photo-detectors show excellent sensitivity. The specific detectivity, D*, of SiC photodiodes are many orders of magnitude higher than the D* of other solid state detectors, and for the first time, comparable to that of photomultiplier tubes (PMTs). SiC APDs have also been fabricated to pursue the ultimate sensitivity. By operating the SiC APDs at a linear mode gain over 10(6), single photon-counting avalanche photodiodes (SPADs) in UV have been demonstrated.
What problem does this paper attempt to address?