Study on Preparation Technique and Characteristics of Vanadium Oxide Thin Films

WEI Xiongbang,WU Zhiming,WANG Tao,XU Qingxian,LI Jianfeng,JIANG Yadong
DOI: https://doi.org/10.3321/j.issn:1005-023x.2007.z1.099
2007-01-01
Abstract:Vanadium oxide thin films are prepared by DC reactive magnetron sputtering method. Technique for preparing the vanadium oxide (VOx) thin films is optimized by precise control to the sputtering voltage. Square resistance and temperature coefficient of square resistance (TCR) of VOx thin films are measured by four-point probe measurement. The atomic ratio and micrographs are investigated by X-ray photoelectron spectroscopy (XPS) and atomic force microscope (AFM) respectively. Results show that the characteristics of VOx thin films are enhanced and proper VOx thin films can be acquired by precisely controlling the sputtering voltage.
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