Density Functional Theory Study of Initial Stage of ZrO2 Atomic Layer Deposition on Ge/Si(100)-(2×1) Surface

W Chen,DW Zhang,J Ren,HL Lu,JY Zhang,M Xu,JT Wang,LK Wang
DOI: https://doi.org/10.1016/j.tsf.2004.11.141
IF: 2.1
2005-01-01
Thin Solid Films
Abstract:The reaction mechanisms of ZrCl4 adsorption and dissociation on Ge/Si(100)-(2×1) surface as the initial stage of ZrO2 atomic layer deposition process are investigated with density functional theory (DFT). The Si–Si, Si–Ge and Ge–Ge one-dimer cluster models are employed to represent Ge/Si(100)-(2×1) surface with different Ge composition. The reaction of ZrCl4 with hydroxylated Ge/Si(100)-(2×1) surface forms a bridged ZrCl2 site, while on H-passivated surface, ZrCl3 site is formed. The reaction energy barrier of ZrCl4 with H-passivated SiGe surface is much higher than ZrCl4 with hydroxylated SiGe surface, which indicates that reaction proceeds more slowly on H-passivated surface than on OH-terminated surface. In addition, adsorption of ZrCl4 is favorable on Ge surface atoms than on Si surface atoms.
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