The Structural and Magnetic Properties For Zn1-xCoxO Thin Films

YU Ping,XIONG Kuang-wei,QIU Dong-jiang
DOI: https://doi.org/10.3969/j.issn.1006-0464.2008.01.010
2008-01-01
Abstract:Zn1-xCoxO thin films were deposited on silicon and quartz substrates by low temperature epitaxy technique at 250,350 and 350 ℃ respectively.The microstructural characterizations were investigated,the results of X-ray diffraction(XRD) demonstrated that Zn1-xCoxO thin films are highly(002) oriented;furthermore obvious polycrystalline are observed and the intensity are stronger with the temperature higher.Ultraviolet-visible light transmission spectra showed that the Wutrize structure of ZnO is present,in despite of Zn ions being partly substituted by Co ions.Moreover the magnetic properties are investigated using magnetization versus temperature and field(M-T and M-H curves) by physical property measurement system(PPMS).According to the results of M-T curve,Zn1-xCoxO films take on ferromagnetism with high Curie temperature(above 300 K).These may render Zn1-xCoxO thin films potential application in spin devices.
What problem does this paper attempt to address?