An Improved Behavioral Model of Ferroelectric Capacitors

Cx Li,Tl Ren,Wq Zhang,J Zhu,Hy Chen,Lt Liu,Zj Li
DOI: https://doi.org/10.1080/10584580108010832
2001-01-01
Integrated Ferroelectrics
Abstract:An improved behavioral model for ferroelectric capacitors is proposed successfully. This model gives accurate simulation results for FeRAM writing and reading process, which helps to the optimization of FeRAM circuit design. The model can also be adapted to express the P-V characteristic of a FE capacitor imposed by nonsymmetrical voltage.
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