An Improved Ferroelectric Capacitor Compact Model Based on Probability Theory for Circuits Simulation

Ying-Jie Zhang,Tian-Ling Ren,Li-Tian Liu
DOI: https://doi.org/10.1080/10584580701759312
2007-01-01
Integrated Ferroelectrics
Abstract:ABSTRACT Improvements have been achieved to perfect the behavior model that we published before and the temperature performance can be integrated easily while the physical meaning of the parameters is clearer. Central Limit Theorem is the mathematical basis of this advanced model and the Preisach assumption is the physical basis. The simulation precision doesn't decrease.
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