Massimiliano Stengel,David Vanderbilt,Nicola A. Spaldin
Abstract:First-principles modeling of ferroelectric capacitors presents several technical challenges, due to the coexistence of metallic electrodes, long-range electrostatic forces and short-range interface chemistry. Here we show how these aspects can be efficiently and accurately rationalized by using a finite-field density-functional theory formalism in which the fundamental electrical variable is the displacement field D. By performing calculations on model Pt/BaTiO3/Pt and Au/BaZrO3/Au capacitors we demonstrate how the interface-specific and bulk-specific properties can be identified and rigorously separated. Then, we show how the electrical properties of capacitors of arbitrary thickness and geometry (symmetric or asymmetric) can be readily reconstructed by using such information. Finally, we show how useful observables such as polarization and dielectric, piezoelectric and electrostrictive coefficients are easily evaluated as a byproduct of the above procedure. We apply this methodology to elucidate the relationship between chemical bonding, Schottky barriers and ferroelectric polarization at simple-metal/oxide interfaces. We find that BO2-electrode interfaces behave analogously to a layer of linear dielectric put in series with a bulk-like perovskite film, while a significant non-linear effect occurs at AO-electrode interfaces.
What problem does this paper attempt to address?
### Problems the paper attempts to solve
This paper aims to solve several technical challenges in ferroelectric capacitor modeling, especially how to deal with the co - existence of metal electrodes, long - range electrostatic interactions and short - range interface chemistry. Specifically:
1. **Electrostatics at the interface between metal electrodes and ferroelectric materials**: The influence of metal electrodes on ferroelectric thin films is a complex problem. Especially at the nanoscale, the electrostatics characteristics of the electrode - ferroelectric interface have an important impact on device performance. The traditional Landau - Ginzburg theory usually simplifies the interface effect by assuming a "dead layer", but this method may not be accurate enough in some cases.
2. **The relationship between electric field and polarization**: The electrical properties of ferroelectric capacitors, such as polarization, dielectric constant, piezoelectric coefficient and electrostrictive coefficient, are affected by electrodes and interfaces. How to accurately describe these properties from first - principles and separate the interface characteristics and bulk material characteristics is the focus of this paper.
3. **Reconstruction of capacitors with arbitrary thickness and geometric shapes**: The author hopes that through the proposed method, the electrical properties of capacitors with arbitrary thickness and geometric shapes (symmetric or asymmetric) can be reconstructed, and important observables such as polarization, dielectric, piezoelectric and electrostrictive coefficients can be easily calculated.
4. **Treatment of nonlinear effects**: In some interfaces (such as AO - electrode interfaces), there are significant nonlinear effects, which cannot be described by the simple "constant interface capacitance" model. Therefore, a method is needed to deal with these nonlinear effects and incorporate them into the overall electrical behavior of the capacitor.
### Main contributions
The paper proposes to use the finite - field density - functional theory (DFT) framework, in which the basic electrical variable is the displacement field \( \mathbf{D} \), and solve the above problems through constrained - \( \mathbf{D} \) calculations. This method allows the author to:
- Accurately describe the interface and bulk material characteristics of ferroelectric capacitors.
- Separate the interface - specific and bulk - material - specific properties.
- Reconstruct the electrical properties of capacitors with arbitrary thickness and geometric shapes.
- Describe and explain the relationship between chemical bonding, Schottky barrier and ferroelectric polarization.
Through this method, the author shows how to comprehensively study the electrical properties of the electrode/ferroelectric interface from first - principles without relying on any prior assumptions.