A NEW TECHNIQUE FOR X-RAY STRESS MEASUREMENT BASED ON USING IMAGE PLATE

Bo HONG,Chuan-hai JIANG
DOI: https://doi.org/10.3969/j.issn.1001-4012.2007.02.008
2007-01-01
Abstract:A new technique for X-ray stress measurement has been introduced.The formula of calculating stress are inferred according to the theory of X-ray diffraction and the geometry of back-reflection for X-ray area detector,called an imaging plate(IP).According to the result of the example obtained by the present method,there are some advantages: rapid plane stress analysis and credible measured value.
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