Microstructural observations of Ta/Al superlattices by TEM

S. S. Jiang,J. Zou,D. J. H. Cockayne,A. Sikorski,A. Hu,R. W. Peng
DOI: https://doi.org/10.1002/pssa.2211300214
1992-01-01
Abstract:Ta/Al multilayer films are fabricated by magnetron sputtering. Cross-section transmission electron microscopy (XTEM) shows the well-formed layer structures of Ta/Al superlattices. The modulation wavelength of the superlattice can be determined from the spacing of high order satellites in the low angle regions of both electron and X-ray diffraction patterns. The cross-section dark field images and the plan-view diffraction patterns show that the in-plane structures of Ta and Al are polycrystalline and that the grain sizes of crystals are small. The majority of crystals have Ta [110] and Al [111] textures in the growth direction of multilayer films. The microstructures of interfaces between Ta (110) and Al (111) are briefly studied by high resolution electron microscopy (HREM).
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