Cross-sectional TEM studies of YBa2Cu3O7-x superlattices

Li Yijie,Lian Guijun,Gan Zizhao,Feng Jingwei
1995-01-01
Abstract:Microstructure of high-quality YBa2Cu3O7-x superlattices has been investigated using high-resolution transmission electron microscope (HRTEM). The observations revealed that the superlattices had atomic sharp interfaces between YBCO and PrBCO layers without interdiffusion. But undulations and steps of the layer thickness existed in the specimen. An intermediate layer about 1 nm in thickness with many defects, which was caused by the surface steps and dislocations at SrTiO3 substrate surface, was observed at the film-substrate interfaces. However, the films did not have large extended defects beyond several unit cells. The results suggested that when studying the two-dimensional transport properties and superconducting mechanism of YACO using YBCO/PrBCO superlattices or ultra-thin YBCO films, the influence of the microstructural elements must be taken into account.
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