Evolution of microstructure and electrical resistivity of Cu–12wt.%Ag filamentary microcomposite with drawing deformation

L. Zhang,L. Meng
DOI: https://doi.org/10.1016/j.scriptamat.2005.03.016
IF: 6.302
2005-01-01
Scripta Materialia
Abstract:Cu–12wt.%Ag filamentary microcomposite was prepared by heavy cold drawing. The microstructure was observed and the electrical resistivity determined at different strain levels. The mechanism responsible for the electronic conduction was discussed according to the microstructure evolution during drawing deformation.
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