Structure and Properties of Sol-Gel Processed (pb,la)tio3 Ferroelectric Thin Films

Liu Meidong,Wang Peiying,Li Churong,Wu Guoan,Rao Yunhua,Zeng Yike
DOI: https://doi.org/10.1080/10584589408223887
1994-01-01
Integrated Ferroelectrics
Abstract:The influence of heat treatment and substrate materials on PLT thin films by sol-gel processing has been researched. Epitaxial growth PLT thin films with perovskite-type structure on sapphire, SrTiO3 and MgO single crystal substrates have been prepared. The epitaxial relations are (100)PLT28/(100)SrTiO3, (111)PLT28//(0001)sapphire and (100)PLT14//(100)MgO. The PLT polycrystal thin films with perovskite-type structure on Si single crystal and quartz glass substrates have been prepared. The remanent polarization Pr and the coercive field Ec of PLT15 ceramic thin films are 7.7 μc/cm2 and 34 kv/cm at 4 KHz respectively. The optical transmittance of PLT28 ceramic thin films within the wavelength range of λ = 500–1000 nm is approximately 80%.
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