Enhanced Pockels Effect in GaN∕AlxGa1−xN Superlattice Measured by Polarization-Maintaining Fiber Mach-Zehnder Interferometer
P. Chen,X. G. Tu,S. P. Li,J. C. Li,W. Lin,H. Y. Chen,D. Y. Liu,J. Y. Kang,Y. H. Zuo,L. Zhao,S. W. Chen,Y. D. Yu,J. Z. Yu,Q. M. Wang
DOI: https://doi.org/10.1063/1.2759267
IF: 4
2007-01-01
Applied Physics Letters
Abstract:Six-period 4nm GaN∕10nm AlxGa1−xN superlattices with different Al mole fractions x were prepared on (0001) sapphire substrates by low-temperature metal-organic chemical vapor deposition. The linear electro-optic (Pockels) effect was studied by a polarization-maintaining fiber-optical Mach-Zehnder interferometer system with an incident light wavelength of 1.55μm. The measured electro-optic coefficients, γ13=5.60±0.18pm∕V, γ33=19.24±1.21pm∕V (for sample 1, x=0.3), and γ13=3.09±0.48pm∕V, γ33=8.94±0.36pm∕V (for sample 2, x=0.1), respectively, are about ten times larger than those of GaN bulk material. The enhancement effect in GaN∕AlxGa1−xN superlattice can be attributed to the large built-in field at the interfaces, depending on the mole fraction of Al.