Investigation on Filament Temperature Characteristic for Vacuum Fluorescent Display

Zhang Jianping,Zhao Wei,Wang Ruitao
DOI: https://doi.org/10.3969/j.issn.0253-2328.2011.01.012
2011-01-01
Abstract:In order to carry out effective parameter control and optimal selection for filament temperature of Vacuum Fluorescent Display(VFD) during the process of exhausting,activating and aging,and improve product qualification rate,the data of filament current were measured at each step voltage.The calculation and analysis on filament temperature characteristic were achieved by applying fundamental algorithm model for establishing filament temperature characteristic,least square method for fitting the linear relationship between filament temperature and filament resistivity,and Newton iterative method for calculating filament temperature with each voltage.Furthermore,the software was self-developed for engineering application.Research results show that filament resistivity has a linear relation with filament temperature;the changes between filament temperature and filament voltage or filament current are accurately fitted by Weibull distribution,and the calculated ones have small errors and high accuracy comparing with the measured filament current.The proposed theoretical model,test planning and calculation method can provide significant theoretical foundation and technical guidance for VFD standard design on filament temperature characteristic.
What problem does this paper attempt to address?