A Devices for Measuring Low Temperature of Filament in Ion Source of VG 354 Thermal Ionization Mass Spectrometer and Its Application

YK Xiao,HZ Wei,QZ Wang,CG Zhang,AD Sun
DOI: https://doi.org/10.3321/j.issn:0253-3820.2002.10.030
IF: 1.193
2002-01-01
Chinese Journal of Analytical Chemistry
Abstract:A device was designed to measure low temperature of filament in ion source of VG 354 thermal ionization mass spectrometry by assembling thermocouple thermometer and connector. This device can he used to measure instantly temperature on the surface of single filament in ion source. The functional correlation between the measured temperature of filament and the heating current through the filament was characterized by aft equation of y = -ax(3) + bx(2) - cx + d. The error of measured temperature is less than +/- 2 degreesC. The device was also applied to study the characteristics of non-reductive thermal ion emission of graphite in thermal ionization mass spectrometry and to study mechanism of M2BO2+ and M2X+ emission in the presence of graphite.
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