Constant Stress Accelerated Life Tests and Statistical Analysis for VFD under Weibull Distribution Case

张建平,王睿韬

DOI: https://doi.org/10.3969/j.issn.1007-2780.2010.02.010

2010-01-01

Chinese Journal of Liquid Crystals and Displays

Abstract:In order to estimate the reliable lifetime of Vacuum Fluorescent Display (VFD) more accurately,and reduce testing time,four constant stress accelerated life tests (CSALT) were conducted by establishing accelerated life test model. The statistical analysis on test data was achieved by applying the Weibull model to describe the lifetime distribution,and Least Square Method (LSM) to estimate the Weibull parameters. Furthermore,accele-rated life equation was determined and self-developed software was employed to predict the VFD lifetime. The numerical results show that test design scheme of CSALT is correct and feasible,that the VFD lifetime follows Weibull distribution,that the life-stress relationship meets linear Arrhenius equation completely,and that the VFD failure mechanism keeps constant at each temperature stress. The proposed methods and the estimated reliable lifetime of VFD can provide some significant guideline to its manufacturers and technicians.