Constant-Step Stress Accelerated Life Tests of White OLED by BRM

ZHANG Jian-ping,WU Liang,CHENG Guo-liang,ZHOU Ting-jun,ZHU Wen-qing
DOI: https://doi.org/10.3788/yjyxs20122702.0187
2012-01-01
Abstract:In order to acquire the life information of white OLED,two constant and one step stress accelerated life tests(ALT) were conducted with current stress increased.Weibull Distribution function was applied to describing the life distribution,Bilinear Regression Method(BRM) was employed to estimate the Weibull parameters,and the accelerated life equation was determined.The Kolmogorov-Smirnov test was performed to verify whether the White OLED life met the Weibull distribution or not,and the software developed by authors was used to calculate the average life and median life.The numerical results indicate that the test plans of constant-step ALT are feasible and versatile,that the OLED life follows the Weibull distribution,and that the life-stress relationship satisfies linear Arrhenius equation completely.The precise accelerated parameter is shown to be particularly useful to predict the OLED life within shorter time.
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