Abstract:With the rapid development of the light emitting diode (LED) industry, the issue of its life has also attracted significant attention. How to accurately and quickly obtain the conventional life of LED light has become an urgent problem to be solved in recent years. In this work, a life test based on conventional stress was carried out to gain the average luminance degradation data for samples with time, and then set up life prediction model based on three-parameter Weibull function and right approximation method to process test data. The average life of the samples was calculated in combination with the failure criteria, and the life prediction of LED light was achieved. The results indicate that the average luminance degradation data obtained by the life test under conventional stress basically shows a nonlinear decay trend, which is in line with the luminance degradation law of general optoelectronic devices. The determination coefficient for the fitted curve of three-parameter Weibull right approximation method (TPWRAM) is 0.9994, which is very close to 1, indicating that the method has a high level of fitting accuracy. The mean relative error of average luminance degradation data under conventional stress is 0.559%, demonstrating that TPWRAM has high accuracy in predicting the conventional life of LED light. The average life of the samples was deduced, which can be used to verify the effectiveness of the assumptions proposed in the accelerated degradation test and provide crucial guidance for LED light production.

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