Investigation on accelerated life test of VFD based on lognormal distribution

ZHANG Jian-ping,LI Zhi-neng
DOI: https://doi.org/10.3785/j.issn.1008-973x.2006.12.028
2006-01-01
Abstract:To forecast the life of vacuum fluorescent display(VFD) in shorter time,an experimental scheme of the accelerated predicted-life test was presented. When the VFD filament stress temperature was increased,two groups of constant stress temperature accelerated life tests and a group of step stress temperature accelerated life test were conducted.After the life distribution of VFD was described by applying the lognormal distribution function,the equalizing value and the standard deviation were estimated using the least square method(LSM),and the statistics and analysis on constant stress and step stress temperature test data were achieved.The predicted-life software was self-designed.The numerical results show that the scheme is correct and feasible,and that the VFD life is characterized by lognormal distribution,the accelerated model meets Arrhenius equation.Accurate calculation of the acceleration parameters enables rapid estimation of VFD life.
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