Abstract:Accelerated life-tests (ALTs) are used for inferring lifetime characteristics of highly reliable products. In particular, step-stress ALTs increase the stress level at which units under test are subject at certain pre-fixed times, thus accelerating the product's wear and inducing its failure. In some cases, due to cost or product nature constraints, continuous monitoring of devices is infeasible, and so the units are inspected for failures at particular inspection time points. In a such setup, the ALT response is interval-censored. Furthermore, when a test unit fails, there are often more than one fatal cause for the failure, known as competing risks. In this paper, we assume that all competing risks are independent and follow exponential distributions with scale parameters depending on the stress level. Under this setup, we present a family of robust estimators based on density power divergence, including the classical maximum likelihood estimator (MLE) as a particular case. We derive asymptotic and robustness properties of the Minimum Density Power Divergence Estimator (MDPDE), showing its consistency for large samples. Based on these MDPDEs, estimates of the lifetime characteristics of the product as well as estimates of cause-specific lifetime characteristics are then developed. Direct asymptotic, transformed and, bootstrap confidence intervals for the mean lifetime to failure, reliability at a mission time and, distribution quantiles are proposed, and their performance is then compared through Monte Carlo simulations. Moreover, the performance of the MDPDE family has been examined through an extensive numerical study and the methods of inference discussed here are finally illustrated with a real-data example concerning electronic devices.

Reliability Assessment for Dual Constant‐Stress Accelerated Life Test Based on Weibull Distribution With Type‐II Censoring

Reliability inference for dual constant-stress accelerated life test with exponential distribution and progressively Type-II censoring

Interval estimation of the two-parameter exponential constant stress accelerated life test model under Type-II censoring

Inference on Weibull inverted exponential distribution under progressive first-failure censoring with constant-stress partially accelerated life test

Selecting the most reliable design under type-II censored accelerated testing

Accelerated Life Testing (ALT) Design Based on Computational Reliability Analysis

Reliability estimation from two types of accelerated testing considering individual difference and measurement error

Inference on constant stress accelerated life tests for log-location-scale lifetime distributions with type-I hybrid censoring

Inference on exponentiated Rayleigh distribution with constant stress partially accelerated life tests under progressive type-II censoring

Estimating Accelerated Life Test Using Constant Stress for Inverse Gaussian Distribution under Type-II Censoring

Accelerated Life Test Planning for Minimizing Misclassification Risks

Statistical Analysis of Inverse Weibull Constant-Stress Partially Accelerated Life Tests with Adaptive Progressively Type I Censored Data

Optimal Design of Reliability Acceptance Sampling Plan Based on Data Obtained from Partially Accelerated Life Test (PALT)

Design of Reliability Acceptance Sampling Plans Under Partially Accelerated Life Test

Design of statistically and energy-efficient accelerated life testing experiments

Robust inference for an interval-monitored step-stress experiment with competing risks for failure

Reliability estimation for one-shot devices under cyclic accelerated life-testing

Inference for constant-stress Weibull competing risks model under generalized progressive hybrid censoring

Robust inference for intermittently-monitored step-stress tests under Weibull lifetime distributions

Robust Rao-type tests for step-stress accelerated life-tests under interval-monitoring and Weibull lifetime distributions

Acceptance sampling plan of accelerated life testing for lognormal distribution under time-censoring