Abstract:Accelerated life-tests (ALTs) are used for inferring lifetime characteristics of highly reliable products. In particular, step-stress ALTs increase the stress level at which units under test are subject at certain pre-fixed times, thus accelerating the product's wear and inducing its failure. In some cases, due to cost or product nature constraints, continuous monitoring of devices is infeasible, and so the units are inspected for failures at particular inspection time points. In a such setup, the ALT response is interval-censored. Furthermore, when a test unit fails, there are often more than one fatal cause for the failure, known as competing risks. In this paper, we assume that all competing risks are independent and follow exponential distributions with scale parameters depending on the stress level. Under this setup, we present a family of robust estimators based on density power divergence, including the classical maximum likelihood estimator (MLE) as a particular case. We derive asymptotic and robustness properties of the Minimum Density Power Divergence Estimator (MDPDE), showing its consistency for large samples. Based on these MDPDEs, estimates of the lifetime characteristics of the product as well as estimates of cause-specific lifetime characteristics are then developed. Direct asymptotic, transformed and, bootstrap confidence intervals for the mean lifetime to failure, reliability at a mission time and, distribution quantiles are proposed, and their performance is then compared through Monte Carlo simulations. Moreover, the performance of the MDPDE family has been examined through an extensive numerical study and the methods of inference discussed here are finally illustrated with a real-data example concerning electronic devices.

Inference on constant stress accelerated life tests for log-location-scale lifetime distributions with type-I hybrid censoring

Interval estimation of the two-parameter exponential constant stress accelerated life test model under Type-II censoring

Reliability inference for dual constant-stress accelerated life test with exponential distribution and progressively Type-II censoring

Inference for constant-stress Weibull competing risks model under generalized progressive hybrid censoring

Inference on exponentiated Rayleigh distribution with constant stress partially accelerated life tests under progressive type-II censoring

Estimating Accelerated Life Test Using Constant Stress for Inverse Gaussian Distribution under Type-II Censoring

Statistical Analysis of Inverse Weibull Constant-Stress Partially Accelerated Life Tests with Adaptive Progressively Type I Censored Data

Inference on Weibull inverted exponential distribution under progressive first-failure censoring with constant-stress partially accelerated life test

Reliability Assessment for Dual Constant‐Stress Accelerated Life Test Based on Weibull Distribution With Type‐II Censoring

Acceptance sampling plan of accelerated life testing for lognormal distribution under time-censoring

Robust Rao-type tests for step-stress accelerated life-tests under interval-monitoring and Weibull lifetime distributions

Poisson–logarithmic half-logistic distribution with inference under a progressive-stress model based on adaptive type-II progressive hybrid censoring

Analysis for constant-stress model on multicomponent system from generalized inverted exponential distribution with stress dependent parameters

Optimal Constant-Stress Accelerated Life Test Plans for One-Shot Devices with Components Having Exponential Lifetimes under Gamma Frailty Models

Reliability estimation for one-shot devices under cyclic accelerated life-testing

Statistical Inference for Lognormal Distribution with Type-I Progressive Hybrid Censored Data

Robust inference for an interval-monitored step-stress experiment with competing risks for failure

Semiparametric inference for the accelerated life model with time-dependent covariates

Bayesian inference for Maxwell Boltzmann distribution on step-stress partially accelerated life test under progressive type-II censoring with binomial removals

Inferences for Exponentiated Gamma Constant-Stress Partially Accelerated Life Test Model Based on Generalized Type-I Hybrid Censored Data

Statistical Analysis of the Log-Normal Distribution under Type-II Progressive Hybrid Censoring Schemes