Optimal Design of Reliability Acceptance Sampling Plan Based on Data Obtained from Partially Accelerated Life Test (PALT)

M. Kumar,P. N. Bajeel,P. C. Ramyamol
DOI: https://doi.org/10.1142/S0218539320400021
2019-11-25
International Journal of Reliability, Quality and Safety Engineering
Abstract:In this paper, constant–stress partially accelerated life tests (PALT) are considered for a product with the assumption that the lifetime of the product follows Weibull distribution with known shape parameter and unknown scale parameter. Based on data obtained using Type-II censoring, the maximum likelihood estimates (MLEs) of the Weibull parameters and acceleration factor are obtained assuming linear and Arrhenius relationships with the lifetime characteristics and stress. Exact distributions of the MLEs of the parameters of Weibull distribution are also obtained. Optimal acceptance sampling plans are developed using both linear and Arrhenius relationships. Some numerical results are also presented to illustrate the resulted test plans.
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