Selecting the most reliable design under type-II censored accelerated testing

D.-S. Chang,D.-Y. Huang,S.-T. Tseng
DOI: https://doi.org/10.1109/24.249592
IF: 5.883
1992-01-01
IEEE Transactions on Reliability
Abstract:Accelerated life tests (ALTs) of products and materials are used to obtain reliability information within a reasonable time frame. However, there are no suitable selection rules for selecting the best product or material as a result of the ALT. Under the type-II censoring plan, a reasonable selection rule for an ALT using the Arrhenius model is proposed. The advantages of this selection rule are compared with a nonALT selection rule by using as criteria the average ratio of time-saving in life testing and sample size. The tradeoff between an increased sample size and a shortened life testing time for the ALT selection procedure is feasible.<>
engineering, electrical & electronic,computer science, software engineering, hardware & architecture
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