Indium-incorporation-induced Transformation of Optical, Photoluminescence and Lasing Properties of InGaN Epilayers

MY Ryu,E Kuokstis,CQ Chen,JW Yang,G Simin,MA Khan,GG Sim,PW Yu
DOI: https://doi.org/10.1016/s0038-1098(03)00147-9
IF: 1.934
2003-01-01
Solid State Communications
Abstract:A comparative combined study of photoluminescence (PL), PL kinetics, stimulated emission (SE) and photoreflectance (PR) properties in InxGa1−xN epilayers is carried out in the composition range 0≤x≤0.19. In-incorporation up to 4% leads to the sufficient longer radiative recombination decay time due to the decrease in non-radiative recombination channels, which are peculiar to GaN, and band-to-band optical transitions predominate the spontaneous PL spectrum. Further In-incorporation (x>4%) leads to the localization of carriers and/or excitons at band-tails in the In-rich areas. Correlation between the position of dominant low-energy PR oscillation due to the main band gap and SE peak position shows that band-to-band transitions are responsible for lasing and dominate the PL spectrum in all highly pumped InxGa1−xN samples.
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