Abstract:Testing for delay faults after chip manufacturing is critical to correct chip operation. Tests for delay faults are applied using scan chains that provide access to internal memory elements. As a result, a circuit may operate under non-functional operation conditions during test application. This may lead to overtesting. The extraction of broadside tests from functional test sequences ensures that the tests create functional operation conditions. When N functional test sequences of length L + 1 are available, the number of broadside tests that can be extracted is N · L . Depending on the source of the functional test sequences, the value of N · L may be large. In this case, it is important to select a subset of n ≤ N sequences, and consider only the first l ≤ L clock cycles of every sequence for the extraction of n · l ≪ N · L broadside tests. The two-dimensional N × L search space for broadside tests is the subject of this article. Using a static procedure that considers fixed values of n and l , the article demonstrates that, for the same value of n · l , different circuits benefit from different values of n and l . It also describes a dynamic procedure that matches the parameters n and l to the circuit. The discussion is supported by experimental results for transition faults in benchmark circuits.

Design for Easily Applying Test Vectors to Improve Delay Fault Coverage

A Novel Test Application Scheme for High Transition Fault Coverage and Low Test Cost

Generating Compact Robust and Non-Robust Tests for Complete Coverage of Path Delay Faults Based on Stuck-at Tests.

Scan Testing for Complete Coverage of Path Delay Faults with Reduced Test Data Volume, Test Application Time, and Hardware Cost

Conflict Driven Scan Chain Configuration for High Transition Fault Coverage and Low Test Power

On Full Path Delay Fault Testability of Combinational Circuits

Non-Scan Design For Testability Based On Fault Oriented Conflict Analysis

Scan Flip-Flop Grouping to Compress Test Data and Compact Test Responses for Launch-on-Capture Delay Testing

New Techniques for Accelerating Small Delay ATPG and Generating Compact Test Sets

Non-Scan Design For Testability For Synchronous Sequential Circuits Based On Fault-Oriented Conflict Analysis

A New Configuration Scheme for Delay Test in Non-Simple LUT FPGA Designs

A Novel Scheme for Application-Dependent Testing of FPGAs

A Novel Hybrid Delay Testing Scheme with Low Test Power, Volume, and Time

2D Search Space for Extracting Broadside Tests from Functional Test Sequences

Sequential circuit ATPG using combinational algorithms

Test compaction for small-delay defects using an effective path selection scheme

Compact Test Generation for Small-Delay Defects Using Testable-Path Information

Test Pattern Generation for Crosstalk-Induced Delay Faults Based on MAF Model

An Algorithm for Fault Diagnosis Based on Combinatorial Design Approach for Testing

Fast And Effective Fault Simulation For Path Delay Faults Based On Selected Testable Paths

Partial Scan Design Based on Circuit State Information