Abstract:Dislocations, line defects in crystalline materials, play an essential role in the mechanical[1,2], electrical[3], optical[4], thermal[5], and phase transition[6] properties of these materials. Dislocation motion, an important mechanism underlying crystal plasticity, is critical for the hardening, processing, and application of a wide range of structural and functional materials[1,7,8]. For decades, the movement of dislocations has been widely observed in crystalline solids under mechanical loading[9-11]. However, the goal of manipulating dislocation motion via a non-mechanical field alone remains elusive. Here, we present real-time observations of dislocation motion controlled solely by an external electric field in single-crystalline zinc sulfide (ZnS). We find that 30° partial dislocations can move back and forth depending on the direction of the electric field, while 90° partial dislocations are motionless. We reveal the nonstoichiometric nature of dislocation cores using atomistic imaging and determine their charge characteristics by density functional theory calculations. The glide barriers of charged 30° partial dislocations, which are lower than those of 90° partial dislocations, further decrease under an electric field, explaining the experimental observations. This study provides direct evidence of dislocation dynamics under a non-mechanical stimulus and opens up the possibility of modulating dislocation-related properties.

Reflection Electron Microscopy Observations of Dislocations and Dislocation Motion in Zinc Oxide

REM OBSERVATIONS OF FRACTURE-BEHAVIOR AND CRYSTAL POLARITY OF ZNO SINGLE-CRYSTALS

Effect of Solution Concentrations on Crystal Structure, Surface Topographies and Photoluminescence Properties of ZnO Thin Films

Reflection electron imaging of free surfaces and surface/dislocation interactions

Preface of 16th International Conference on Defects, Recognition, Imaging and Physics in Semiconductors

An EPR study of point defects in zinc oxide thin films

Identification of Dislocations on Crystal Surfaces

Harnessing dislocation motion using an electric field

Diffraction contrast in reflection electron microscopy—I. Screw dislocation

Investigation of the non-volatile resistance change in noncentrosymmetric compounds

In SituObservation of Dislocation Behavior in Nanometer Grains

Engineering of Optical and Electrical Properties of ZnO by Non-Equilibrium Thermal Processing: the Role of Zinc Interstitials and Zinc Vacancies

Effects of Surface Stress Relaxation on Reflection Electron Microscopy Images of Normal Emerging Edge Dislocations

Further characterization of oxygen vacancies and zinc vacancies in electron-irradiated ZnO

Diffraction Contrast in Reflection Electron Microscopy—ii. Surface Steps and Dislocations under the Surface

Studies of Mn/ZnO (0001̄) Interfacial Formation and Electronic Properties with Synchrotron Radiation

Hall effect measurements on ZnO accumulation layers

Plastic deformation of ZnO thin films through edge and screw dislocation movements

In situ atomic-scale observation of dislocation climb and grain boundary evolution in nanostructured metal

Molecular dynamics simulations and photoluminescence measurements of annealed ZnO surfaces

Subangstrom profile imaging of relaxed ZnO(101̄0) surfaces