InP (110) by Time-resolved XPS

Z. W. Deng,R. W. M. Kwok,W. M. Lau,L. L. Cao
DOI: https://doi.org/10.1116/1.1379510
2000-01-01
Abstract:Time-resolved binding energy (BE) changes of the In 3d5/2 level of heavily doped n-InP (100) (S-doped with a carrier density of 2.4 × 1017 cm−3) and p-InP (100) (Zn-doped with a carrier density of 3.9 × 1018 cm−3) after cleaving in UHV were measured by XPS. Also presented are spectra of survey, In 3d5/2 and P 2p levels after the BE stopped shifting. Measurements were carried out on the in situ cleaved (110) facets. The results show nearly flat band surface as cleaved in UHV. The subsequent binding energy changes reflected the Fermi level shift in the band gap relative to the valence band maximum induced by surface states which are believed to be a consequence of surface lattice relaxation after cleavage. The accurate BE of the as cleaved P 2p level can be obtained via interpolation according to the BE changes of In 3d5/2.
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