A Carrier-Based Analytic Model for Undoped (Lightly Doped) Ultra-Thin-Body Silicon-on-Insulator (UTB-SOI) MOSFETs

Jin He,Xing Zhang,Ganggang Zhang,Yangyuan Wang
DOI: https://doi.org/10.1109/ISQED.2006.5
2006-01-01
Abstract:This paper presents a carrier-based analytic model for Ultra-Thin-Body Silicon-on-Insulator (UTB-SOI) MOSFETs. It is based on the exact solution of the Poisson-Boltzamann equation by a carrier approach and the current continuity equation with the back interface oxide layer effect. The mode is valid for all the operation regions (linear, saturation, subthreshold) and traces the transition between them without fitting-parameters, being ideal framework for UTB MOSFET compact modelling development. We have demonstrated that the I-V characteristics obtained by this model agree with twodimensional numerical simulations for all ranges of gate and drain voltages.
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