A Charge-Based Capacitance Model for Double-Gate Tunnel FETs With Closed-Form Solution
Bin Lu,Hongliang Lu,Yuming Zhang,Yimen Zhang,Xiaoran Cui,Zhijun Lv,Shi-Zheng Yang,Chen Liu
DOI: https://doi.org/10.1109/TED.2017.2775341
IF: 3.1
2018-01-01
IEEE Transactions on Electron Devices
Abstract:Based on an analytical surface potential and a simple mathematical approximation for the source depletion width, a physics-based capacitance model with closed form for silicon double-gate tunnel field-effect transistors (TFETs) is developed. Good agreements between the proposed model and the numerical simulations have been achieved, which reveal that the tunneling carriers from source have negligi...