Drift of Schottky Barrier Height in Phase Change Materials

Rivka-Galya Nir-Harwood,Guy Cohen,Amlan Majumdar,Richard Haight,Emanuel Ber,Lynne Gignac,Efrat Ordan,Lishai Shoham,Yair Keller,Lior Kornblum,Eilam Yalon
DOI: https://doi.org/10.1021/acsnano.3c11019
IF: 17.1
2024-03-10
ACS Nano
Abstract:Phase-change memory (PCM) devices have great potential as multilevel memory cells and artificial synapses for neuromorphic computing hardware. However, their practical use is hampered by resistance drift, a phenomenon commonly attributed to structural relaxation or electronic mechanisms primarily in the context of bulk effects. In this study, we reevaluate the electrical manifestation of resistance drift in sub-100 nm Ge(2)Sb(2)Te(5) (GST) PCM devices, focusing on the contributions of bulk vs...
materials science, multidisciplinary,chemistry, physical,nanoscience & nanotechnology
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