Engineering Grains of Ge2sb2te5 for Realizing Fast-Speed, Low-Power, and Low-Drift Phase-Change Memories with Further Multilevel Capabilities

W. J. Wang,D. Loke,L. T. Law,L. P. Shi,R. Zhao,M. H. Li,L. L. Chen,H. X. Yang,Y. C. Yeo,A. O. Adeyeye,T. C. Chong,A. L. Lacaita
DOI: https://doi.org/10.1109/iedm.2012.6479143
2012-01-01
Abstract:Phase-change memory (PCM) represents one of the best candidates for a “universal memory”. However, its slow SET speed, high RESET power, and high resistance drift present key challenges towards this ambition. Here, grain-engineered Ge 2 Sb 2 Te 5 is exploited to control the crystallization kinetics, and electrical properties of PCM. We report 120 % higher SET speeds with respect to conventional scaling. Good stability (140°C), 30 % RESET power reduction, and 2X lower resistance drift were also achieved. A 4-state/2-bit multilevel cell was further demonstrated. This provides a route to making high-density PCM devices.
What problem does this paper attempt to address?