Enabling Universal Memory by Overcoming the Contradictory Speed and Stability Nature of Phase-Change Materials

Weijie Wang,Desmond Loke,Luping Shi,Rong Zhao,Hongxin Yang,Leong-Tat Law,Lung-Tat Ng,Kian-Guan Lim,Yee-Chia Yeo,Chong,Andrea L. Lacaita
DOI: https://doi.org/10.1038/srep00360
IF: 4.6
2012-01-01
Scientific Reports
Abstract:The quest for universal memory is driving the rapid development of memories with superior all-round capabilities in non-volatility, high speed, high endurance and low power. Phase-change materials are highly promising in this respect. However, their contradictory speed and stability properties present a key challenge towards this ambition. We reveal that as the device size decreases, the phase-change mechanism changes from the material inherent crystallization mechanism (either nucleation- or growth-dominated), to the hetero-crystallization mechanism, which resulted in a significant increase in PCRAM speeds. Reducing the grain size can further increase the speed of phase-change. Such grain size effect on speed becomes increasingly significant at smaller device sizes. Together with the nano-thermal and electrical effects, fast phase-change, good stability and high endurance can be achieved. These findings lead to a feasible solution to achieve a universal memory.
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