Breaking the Speed Limits of Phase-Change Memory

D. Loke,T. H. Lee,W. J. Wang,L. P. Shi,R. Zhao,Y. C. Yeo,T. C. Chong,S. R. Elliott
DOI: https://doi.org/10.1126/science.1221561
IF: 56.9
2012-01-01
Science
Abstract:Phase-change random-access memory (PCRAM) is one of the leading candidates for next-generation data-storage devices, but the trade-off between crystallization (writing) speed and amorphous-phase stability (data retention) presents a key challenge. We control the crystallization kinetics of a phase-change material by applying a constant low voltage via prestructural ordering (incubation) effects. A crystallization speed of 500 picoseconds was achieved, as well as high-speed reversible switching using 500-picosecond pulses. Ab initio molecular dynamics simulations reveal the phase-change kinetics in PCRAM devices and the structural origin of the incubation-assisted increase in crystallization speed. This paves the way for achieving a broadly applicable memory device, capable of nonvolatile operations beyond gigahertz data-transfer rates.
What problem does this paper attempt to address?