The Pixel Charging-up effect in Gas Micro-Pixel Detectors

Difan Yi,Qian Liu,Hongbang Liu,Fei Xie,Huanbo Feng,Lin Zhou,Zuke Feng,Yangheng Zheng

2024-08-05

Abstract:This study investigates the charging-up effect on the Topmetal-II- chip in Gas Micro-Pixel Detectors(GMPD). It is found that this effect differs from the charging-up typically observed in gas detector multiplier devices and increases the relative gain of the detector. The research indicates that this effect originates from the accumulation of charges on the insulating layer of the chip's pixel surface. Iterative simulations using COMSOL and GARFIELD++ are employed to model the variation of detector relative gain with the charging-up effect, and a simple yet effective model is proposed, which aligns well with experimental data. The feasibility of validating the deposition of resistive materials and adjusting the local voltage distribution on the chip to suppress charging-up effects and enhance the relative gain is also verified.

Instrumentation and Detectors,High Energy Physics - Experiment,Nuclear Experiment

What problem does this paper attempt to address?

This paper aims to explore the charging effect of the Topmetal - II chip in the gas micropixel detector (GMPD). Specifically, the study found that this charging effect is different from the charging effect usually observed in gas detector multiplier devices, and it can increase the effective gain of the detector. Research shows that this effect originates from the charge accumulation on the insulating layer on the chip pixel surface. By using COMSOL and GARFIELD++ for iterative simulation, the researchers modeled the influence of the charging effect on the relative gain change of the detector and proposed a simple and effective model, which is in good agreement with the experimental data. In addition, the paper also verified the feasibility of suppressing the charging effect and increasing the relative gain by depositing resistive materials and adjusting the local voltage distribution of the chip.

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