Abstract:The few electrons in valence states of a material participate in many of its physical properties, including both structural and transport properties. In the diffraction of X-rays, or neutrons, valence electrons can lead to weak Bragg reflections that are extremely sensitive signatures of their charge and magnetic degrees of freedom. In this regard, diffraction instruments supplied with X-rays from a synchrotron source are particularly useful because the brightness, tuneability and polarization of the X-rays are all helpful in making valuable observations. The data obtained from Bragg diffraction can be analyzed on the basis of an atomic model, which has the virtue that it can be used as a common platform for the analysis of X-ray and neutron diffraction and, in addition, the analysis of observations made with X-ray absorption, NMR, EPR, muon and Mössbauer spectroscopies. We present the salient features for the calculation of structure factors based on an atomic model and applied to the analysis of Bragg diffraction by non-magnetic and magnetic materials, with an emphasis on resonant X-ray Bragg diffraction. The presentation contains a new treatment of parity-odd events found in the mixed electric dipole–electric quadrupole channel of scattering. In addition we discuss the complementary observation of dichroic signals, including natural circular and magnetochiral dichroism.The survey of available analytical tools is complemented by a series of worked examples demonstrating the application of the formalism to different materials with different crystal structures and resonant ions: dysprosium borocarbide (DyB2C2), vanadium sesquioxide (V2O3), gadolinium tetraboride (GdB4), chromium sesquioxide (Cr2O3), haematite and perovskite-type manganites.

Possibilities of the X-ray diffraction data processing method for detecting reflections with intensity below the background noise component

Method for Identifying Crystalline Phases in X-ray Diffraction Data from Multiphase Samples

Possibilities of Creating X-Ray Acoustic Elements from Bi-Phthalate Family Crystals with Thickness Vibrations

A method of estimating the content of crystalline phases in multiphase samples based on X-ray diffraction data

The Use of Connected Masks for Reconstructing the Single Particle Image from X-Ray Diffraction Data. II. The Dependence of the Accuracy of the Solution on the Sampling Step of Experimental Data

A Flexible Phase Retrieval Framework for Flux-limited Coherent X-Ray Imaging

Quasi-universality and scaling behaviour of three-wave X-ray interference in crystals: A novel way for the quantitative determination of X-ray reflection phases

Quantitative Phase Analysis by X-ray Diffraction—Doping Methods and Applications

Electronic properties of crystalline materials observed in X-ray diffraction

Study on Extraction Method of Phase Information in X-Ray Diffraction Enhanced Imaging

Theoretical Consideration of Experimental Methods for X-Ray Phase Determination Using Multiple Diffraction

Direct determination of X-Ray reflection phases for noncentrosymmetric crystals

X-Ray Diffraction: Instrumentation and Applications

The diffraction power of crystals with unknown atomic structures: calculation and application in quantitative phase analysis

Substrate-mediated Multiwave Resonance Grazing Incidence X-Ray Diffraction in Thin Films: A Method for Direct Phase Determination

Solving The X-Ray Phase Problem For Macromolecular Crystals By Multi-Wave X-Ray Interference

X-ray reflectivity with a twist: quantitative time-resolved X-ray reflectivity using monochromatic synchrotron radiation

Direct Determination Of X-Ray Reflection Phases

Three-Wave Resonance Grazing Incidence X-Ray Diffraction: A Novel Method for Direct Phase Determination of Surface In-Plane Reflections

Data-driven approach for synchrotron X-ray Laue microdiffraction scan analysis

Solution to the X-ray Phase Problem Using Multiple Diffraction—a Review