Abstract:A method is presented for calculating the reference intensity ratio of crystalline phases with unknown atomic arrangements using just the composition and lattice parameters.The reference intensity ratio (RIR) is the intensity ratio of a specified peak of the target crystalline phase to a certain peak of the reference phase in the powder X‐ray diffraction pattern of a mixture of the target and reference phases in a weight ratio of 1:1. The RIR represents the diffraction power of the target phase compared with that of the reference phase. A quantitative phase analysis (QPA) can be readily made on the basis of only a powder pattern when the RIR values of all component phases in the mixture are available. The RIR of a target phase can be measured experimentally or calculated in accordance with its crystal structure. RIR values are given in most powder diffraction files (PDFs) published by the International Centre for Diffraction Data, but there are still more than 110 000 PDFs for which the RIR is absent. Newly discovered phases may be present in a mixture as components of unknown weight fractions, for which the RIR values can be neither measured nor calculated with the currently available method. Herein is presented a new method of calculating the RIR of a crystalline phase from its lattice parameters, the chemical content of the unit cell and a list of normalized intensities of reflections over a sufficiently large diffraction angle range. The new method can be used to calculate not only the absent RIRs in the PDFs but also the RIR of a component phase of a mixture of unknown weight fraction when the lattice parameters and chemical content of the unit cell of the corresponding phase are known.

A method of estimating the content of crystalline phases in multiphase samples based on X-ray diffraction data

Method for Identifying Crystalline Phases in X-ray Diffraction Data from Multiphase Samples

Calculating the reference intensity ratio of crystalline phases with unknown atomic arrangements using the lattice parameters and chemical information

The diffraction power of crystals with unknown atomic structures: calculation and application in quantitative phase analysis

Determination of the Zn Content in Zincian Malachite by X-ray Diffraction

QUANTITATIVE ANALYSIS OF CRYSTAL PHASES IN GLASS-CERAMICS BY X-RAY DIFFRACTION METHOD

Qualitative Phase Analysis System for Crystalline Mixtures Based on X-Ray Powder Diffraction File

Qantitative Determination of Phase for Macromolecular Crystals Using Multiple Diffraction Methods and Dynamical Theory

Quantification of Crystalline Fraction of Solid Slag Film Using X-Ray Powder Diffraction

Quantitative Phase Analysis by X-ray Diffraction—Doping Methods and Applications

Possibilities of the X-ray diffraction data processing method for detecting reflections with intensity below the background noise component

Direct Method of Determining the Lattice Parameters of a Phase from X-ray Diffraction Pattern of Multi-Phase

Quantitative Deviation of Nanocrystals Using the RIR Method in X-ray Diffraction (XRD)

Bayesian inference to identify crystalline structures for XRD

Using Phases Retrieved from Two-Dimensional Projections to Facilitate Structure Solution from X-Ray Powder Diffraction Data

Structural information extracted from the diffraction of XFEL fs-pulses in a crystal

Comments on A new method for quantitative phase analysis using X-ray powder diffraction: direct derivation of weight fractions from observed integrated intensities and chemical compositions of individual phases by Toraya (2016)

Quantitative Analysis of Crystal and Amorphous Phases in Clinker by QXRD/Rietveld Method

Ab Initio Phasing of X-Ray Powder Diffraction Patterns by Charge Flipping

Quantitative Analysis of a Textured Coating by a New X-Ray Diffraction Method

Theoretical Consideration of Experimental Methods for X-Ray Phase Determination Using Multiple Diffraction